TEC RSS Plan du site | Glossaire | Blogue Nouveau!
 
 
Technology Evaluation Centers
Recherche        Recherche avancée
POWERED BY
Synopsis de l'article
 

Leveraging Technology to Maintain a Competitive Edge During Tough Economic Times -- A Panel Discussion Analyzed
Part Two: Business Process Modeling

P.J. Jakovljevic - May 18, 2004

Introduction

At the IFS Executive Forum, which took place on March 29 and 30 in Orlando, Florida (US), leading research analysts and industry experts discussed how companies can still leverage technology to maintain their competitive edge, even during tough economic times. The event was held in conjunction with IFS World Conference 2004, and it included six panel discussions, with each panel including top executives, analysts, and journalists. Some of the renowned panelists were Geoff Dodge, vice president, Business Week; Dave Caruso, senior vice president, AMR Research; Barry Wilderman, vice president, Meta Group; Leo Quinn, vice president of operations, Global Manufacturing Solutions, Rockwell Automation; Dave Brousell, editor-in-chief, Managing Automation; David Berger, Western Management Consultants; and Josh Greenbaum, principal, Enterprise Applications Consulting. Breakout sessions explored such topics as turning global competitive threats into opportunities, increasing the bottom line through operational efficiency, complying with the Sarbanes-Oxley Act of 2002, and using enterprise software to prepare for future challenges...


 
Identifiant:
Mot de passe:
 
Mot de passe oublié?
Nouvel utilisateur? Inscrivez-vous gratuitement!
 

Nota bene:
Vous devez autoriser les témoins (cookies) pour pouvoir visualiser le contenu du site.

Si vous avez du mal à vous connecter, vérifiez les paramètres de votre navigateur ou ceux de votre coupe-feu relatifs aux témoins et assurez-vous que les cookies sont autorisés.

 

Recherches récentes: A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z

TEC: Technology Evaluation Centers

À propos de TEC | Contactez-nous | Partenaires médias | Politiques | Programme de publication d'articles | English | 中文 | 日本語 | Español | Français

© 2008 Technology Evaluation Centers Inc.
Tous droits réservés. Toute reproduction sans autorisation écrite préalable est interdite. UID: 116

58517.82